Patents

[Assignee:  Raytheon  -- Inventor:  Joe Lindley]

“Method and system for generating a predictive analysis of the performance of peer reviews”
Patent # 7,599,819 Issued October 6, 2009

2 additional patent submittals related to predicting the impact of Peer Reviews are pending approval by the US Patent Trademark Office.  One of the submittals has been published:

“Software Defect Forecasting System”
Patent Application # 20100180259 Published July 15, 2010

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